compact. easy. fast.
the Sciospec EIT16
Electrical Impedance Tomography system
The Sciospec EIT16 is Sciospec's standard EIT system. It's a very compact yet powerful instrument with 16 channels. With its outstanding performance the EIT16 has become one of the most popular EIT systems for research and industry.
With its performance and the countless customization opportunities it is put to use in leading research institutes paving the way for new applications of impedance tomography.
The system is designed for measurements for electrical impedance tomography or general multi-port impedance measurement applications. True parallel measurements and tightly synchronized switching allows for fast frame rates.
For easy entry a software provides EIT image reconstruction functionalities for time- and frequency-difference imaging. Alternatively you can just use the MATLAB code and import your data to EIDORS or write your own image reconstruction and import that to our software.
browse through some scientific publications and discover where Sciospec technology helps scientists and engineers advancing research and pushing boundaries.
You want EIT on chip based sensors?
We've got you covered!
We have a lot of experience with chip based sensors for biosensing using electrochemical and impedance analysis. EIT offers some very promising possibilities in that application domain as well, so we went ahead and created a simple way to work on chip based sensors with our EIT instruments - the EIT slide chip adapters.
Whether you want to design your own sensor from scratch or want to use something off the shelf, it is easy to make it fit with our slide chip system through simple and affordable carrier boards. We are happy to help you with your sensor application development - just contact us.
Check out what our friends at the Leibniz Institute for Solid State and Materials Research Dresden did with it:
Electrical impedance tomography in on-chip integrated microtubular fluidic channels.
SM Weiz, M Medina-Sánchez, K Lee, OG Schmidt, Proceedings of the 18th International Conference on Electrical impedance tomography, p 23.
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