Frequency-difference phantom experiment

Frequency-difference phantom experiment

Frequency-difference phantom experiment

Jaesong Jang, Computional Science & Engineering, Yonsei University Seoul, South Korea

The goal is to discriminate admittivity anomaly from background which consists of high-contrast materials. To remove the influence of the inhomogeneous background, linear combinations of multi-frequency EIT (mfEIT) data are used to produce contrast images.

Multiple backgrounds subtraction method is used for the linear combinations of mfEIT data.

Frequency-difference phantom experiment Frequency-difference phantom experiment

 

Frequency-difference phantom experiment

Latest Products

  • Sciospec LCR-1
    LCR Meter

    powerful, yet easy to use LCR meter

    Learn more
  • Medical Research ISX-3

    scalable impedance analyzer with medical grade safety features

    Learn more
  • CSX-64
    CSX-64

    64-channel impedance measurement system

    Learn more

Get in touch with us

+49 3425 88399 00

info@sciospec.com

Sciospec Scientific Instruments GmbH
Leipziger Str. 43b, 04828 Bennewitz, Germany